Accelerated Life Testing of One-Shot Devices: Data Collection And Analysis - (McMaster University; Hamilton, Canadá)
PPGM/UFAM joint Seminar
Scheduled for:
Jun 23, 2021, at 10:00 AM
(GMT-04:00) Standard Time - Manaus
Streaming:
Speaker:
Narayanaswamy Balakrishnan (McMaster University)
Title:
Accelerated Life Testing of One-Shot Devices: Data Collection and Analysis
Abstract:
In this talk, I will explain the problem of one-shot device testing analyses. After giving some motivating data sets, I will describe different methods of inference and also detail inferential methods and optimal designs under constant-stress (CSALT) and stepstress (SSALT) accelerated tests. Several real-life examples and simulation study results will be presented to illustrate all the models and inferential methods described.
Bio:
N. Balakrishnan is a Distinguished University Professor at McMaster University, Hamilton, Ontario, Canada. His research interests are in Ordered data analysis, Univariate and multivariate distribution theory, Reliability theory, Survival analysis, Applied probability, Stochastic orderings, Non-parametric statistics, Censoring methodology, and Statistical inference. He is an author/co-author of fifteen books, and has over 1000 refereed journal papers published or accepted.
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